A dichroic filter, thin-film filter, or interference filter is a very accurate color filter used to selectively pass light of a small range of colors while reflecting other colors. By comparison, dichroic mirrors and dichroic reflectors tend to be characterized by the color(s) of light that they reflect, rather than the color(s) they pass.
FLIR Cameras Reveal Thermal Characteristics of Microelectronic Devices
At the University of Texas at Arlington, the team of Dr. Ankur Jain, who heads the Microscale Thermophysics Laboratory, studies a range of topics related to microscale thermal transport.
Utilizing Flow Cytometry Filters
Used across a variety of biological disciplines, fluorescence-based flow cytometers rapidly and accurately quantify cells and cellular components. As one of the most important components of these systems, flow cytometry filters must be specifically designed to maximize signal-to-noise ratios while minimizing crosstalk between fluorophores.
The Future Is Now: How Glass Micro Bonding Enables A New Era Of Ultra-Reliable Wafer Level Chip Scale Packaging
Innovative Glass Micro Bonding sealing technology is enabling unprecedented miniaturization and wireless signal transmission for medical implants, MEMS devices, and other electronic and optical devices.
Using 1064 nm Dispersive Raman Systems In Biofuel And Plant Research
In the past, raman spectroscopy was not useful for plant-based samples due to their high levels of photosynthetic pigments as the fluorescent backgrounds can overwhelm Raman signals in all visible wavelengths. This issue is resolved by BaySpec’s line of 1064 nm excitation dispersive Raman systems.
The Ophir® FluxGage™ 604 series is a compact measurement system featuring four additional color sensors that are evenly arranged in the bottom of the device delivering further x, y, and CCT data besides the illuminance. The system provides an overview of the color and overall uniformity of the measured light in seconds, allowing for the direct evaluation of LED chips or optical assemblies used for color mixing and beam shaping.
Standard Photodiode Power Sensor: PD300
The Ophir PD300 general purpose photodiode laser measurement sensor features a swivel mount, a removable filter, and a 10 x 10 mm aperture. Without a filter, its spectral range is 350 – 1100 nm and its power measuring range is 500 pW – 30 mW. With a filter the spectral range is 430 nm – 1100 nm and the power range is 200 µW – 300 mW.
High-Speed Optical Power Meter For Fast Photonics Alignment Applications: F-712.PM1
PI introduces the new F-712.PM1 high-speed optical power meter for converting the optical signals and currents of photodiodes into a high-resolution, logarithmic analog voltage signal. The meter also boasts a bandwidth of 20 kHz and extended wavelength range of 400 to 1550 nm.
High-Performance MWIR InSb Camera: FLIR X6800sc
The FLIR X6800sc is a fast, highly sensitive MWIR camera designed for scientists, researchers, and engineers. With advanced triggering and on-camera RAM/SSD recording, this camera offers the functionality to stop motion on high-speed events both in the lab and at the test range. The X6800sc has a cooled FLIR indium antimonide (InSb) detector and captures full 640 x 512 images at 502 frames per second, or up to 29,134 Hz with windowing.
Five Axis Piezo Nanopositioning System: Nano-Man5
The Nano-Man5 is a 5-axis piezo nanopositioning system with closed loop feedback control for absolute position measurement. The compact design makes it easy to integrate into existing instrumentation. The Nano-Man5 is designed for alignment applications that require 3 linear axes combined with tip/tilt capabilities. The included position sensors ensure picometer and nanoradian accuracy under closed loop control.
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Compact XYZ Piezo Stage Combines With Motorized Stages For Complex Nanopositioning Applications
A faster, higher precision variation of PI’s popular NanoCube® XYZ piezo flexure stage is available to combine with a series of miniature motorized micro-positioning stages for nano-scale motion over long travel ranges.
Crystal Structures In Super Slow Motion
Laser beams can be used to change the properties of materials in an extremely precise way. This principle is already widely used in technologies such as rewritable DVDs. However, the underlying processes generally take place at such unimaginably fast speeds and at such a small scale that they have so far eluded direct observation.
MKS Instruments Announces Ophir® Helios Plus Industrial Laser Power Meter For Measuring Blue, Green, And Infrared Wavelengths
MKS Instruments, Inc. (NASDAQ: MKSI), has announced the Ophir® Helios Plus, an expanded version of the Ophir Helios industrial laser power meter. The Helios Plus has all the features of the Helios for measuring a wide range of high power lasers in production operations, as well as the ability to measure additional wavelengths, such as blue and green lasers used in copper welding in the automotive industry.
Ophir Infrared Optics Jerusalem Production Site - A Virtual Tour
Join us for a virtual tour at our Jerusalem production site to learn how we provide a one-stop-shop solution, from design to manufacture, assembly and QA, for optical components and assemblies for IR thermal applications.
A Virtual Tour At The Ophir Laser Optics Jerusalem Production Site
Join us for a virtual tour at our Jerusalem production site to learn how we provide a one-stop-shop solution, from design to manufacture, assembly and QA, for optical components and assemblies for high-power laser applications.
Live Demo Video: Ophir's Long-Range MWIR 48.5-700 mm f/5.5. Now That's A Long Detection Range!!
With an impressive 40km detection range, caught via Sierra Olympics’ Ventus-700, Ophir's long range 48.5-700mm f/5.5 continuous zoom lens provides a crisp image over the full zoom range, with MTF close to the diffraction limit. Providing outstanding detection, recognition, and identification (DRI) ranges, this lens is suitable for a wide range of commercial, surveillance and homeland security applications.
Creating AFM Resonant Probes Using Shattered Silicon
Resonant probes for atomic force microscopy (AFM) can be created using shattered silicon wafers. This video describes how to create silicon shards and then attach them to a quartz tuning fork for use in an AFM.
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