Test and Measurement Equipment

WHITE PAPERS AND CASE STUDIES

New Tool Measures 4 Surface Appearance Quality Conditions Simultaneously
New Tool Measures 4 Surface Appearance Quality Conditions Simultaneously If surface appearance quality is critical to your product, learn about a new manufacturing-friendly tool that allows you to establish numerical standards for and measure four conditions of surface quality: gloss, haze, image clarity, BRDF including Canon’s new parameter “Scattering C20, C60.” This new parameter goes beyond IC and DOI to enable measure of non-glossy surfaces such as textured surfaces, matte paint, and matte...  Continue Reading...
Achieving Standardized Measurements With BeamWatch AM The BeamWatch AM is Ophir-Spiricon’s beam monitoring system designed specifically for use in the additive manufacturing industry to provide non-interfering real-time beam measurement at the location of the working plane. This white paper delivers a comparison of results with those from the NanoScan 2, a widely-accepted scanning-slit technology, and demonstrates that the BeamWatch AM can achieve ISO-compliant measurements when correctly...  Continue Reading...
Laser Beam Diagnostics In GHz Applications
Laser Beam Diagnostics In GHz Applications It usually is insufficient to rely on one standard measurement technology when working with applications in exotic optical wavelengths and unusually low average powers. This white paper goes through an example of calculating many laser beam diagnostics within high GHz applications.  Continue Reading...
What To Expect In A Laser Profiling Demonstration
What To Expect In A Laser Profiling Demonstration When asking someone for a laser beam profiling demonstration, it is important to understand what you are asking for and what you should expect. This white paper covers the steps needed to take to set up a demonstration, and what is expected of each party.  Continue Reading...
Working In The Basement: Measuring Signals Below The Noise Floor With A Lock-In Amplifier
Working In The Basement: Measuring Signals Below The Noise Floor With A Lock-In Amplifier This article presents the advantages of using lock-in amplifiers for measuring signals below the noise floor, how they work, and available devices from Ophir.  Continue Reading...
Sensor Fusion Enables Comprehensive Analysis Of Laser Processing In Additive Manufacturing
Sensor Fusion Enables Comprehensive Analysis Of Laser Processing In Additive Manufacturing This white paper discusses sensor fusion, a process that merges data from numerous sensors to create a more complete understanding of the laser-enabled process.  Continue Reading...
Intro To Laser Management: Laser Profiling 101
Intro To Laser Management: Laser Profiling 101 Traditionally, laser operators only verify a laser’s average power or energy to improve efficiency and, if everything is in order, put their laser back into service. This article discusses steps required to identify and use a camera profiling system (arrayed camera, attenuator, and beam dump) for laser management.  Continue Reading...
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TEST AND MEASUREMENT EQUIPMENT PRODUCTS

Laser Measurement System For Laser-Based Additive Manufacturing: BeamWatch® AM Laser Measurement System For Laser-Based Additive Manufacturing: BeamWatch® AM

The BeamWatch® AM from Ophir® is an integrated laser measurement system created for measuring critical laser beam parameters for laser-based additive manufacturing systems. Simultaneous, real-time measurements are performed at video rates and are available for multiple profiles along the beam caustic in the camera field-of-view (FOV). These measurements include waist (focus spot) width and location, focal shift, centroid, M2 or K, divergence, beam parameter product, Rayleigh length, absolute power, and tilt angle measurements.

Thermal Imaging Measuring System For Electronics Testing: FLIR ETS320 Thermal Imaging Measuring System For Electronics Testing: FLIR ETS320

FLIR offers the new ETS320 affordable, non-contact thermal measurement system designed to collect accurate, reliable data in seconds and analyze it quickly for electronics testing and scientific research. The system pairs a high-sensitivity infrared camera with an integrated stand for hands-free measurements of printed circuit boards and other small electronics.

Surface Reflectance Analyzer: RA-532H Surface Reflectance Analyzer: RA-532H

The Surface Reflectance Analyzer RA-532H is a device designed to comprehensively measure and evaluate the surface conditions of objects. Utilized measurement methods include standard compliant gloss, haze, Image Clarity (IC), and 2-D BRDF (Bidirectional Reflectance Distribution Function) measurements.

  Fastest Multi-Wavelength Meter: 438 Series Fastest Multi-Wavelength Meter: 438 Series

The 438 Series Multi-Wavelength Meter is designed to take the fastest wavelength, power, and OSNR measurements (at 10 Hz) for the analysis of as many as 1000 discrete optical signals. This meter offers high efficiency, straightforward operation, and a rugged design for the most efficient WDM wavelength testing available, even in the most demanding applications.

Compact, All-In-One LED Luminaire Measurement System: FluxGage Compact, All-In-One LED Luminaire Measurement System: FluxGage

The FluxGage is Ophir’s new compact measuring system for LED Luminaires that measures their total flux, color (CCT, CRI, Duv, chromaticity), and flicker. The system measures the total flux using solar panels instead of an integrating sphere, delivering the same functionality in one third of the size. The gauge is capable of measuring any luminaire that fits into its opening.

Laser Beam Profilers Laser Beam Profilers

Laser beam profilers are the optimal solutions for increasing chances of success in the design or applications of new lasers, or when a laser system is no longer meeting the desired specifications. Ophir Photonics offers a wide range of beam profiler choices including CCD and CMOS cameras, scanning slit sensors, InGaAs and pyroelectric cameras, and pinhole and knife edge sensors.

Power Meters for Lasers and other Light Sources Power Meters for Lasers and other Light Sources

Ophir’s series of power meters are designed with the highest sensitivity, lowest noise, and most precise calibrations in order to bring out maximum performance levels from their smart sensors. These power meters and PC interfaces operate on the smart plug principle, meaning that these devices can work with nearly all Ophir sensors.

Energy Sensors Energy Sensors

Ophir Photonics presents a wide range of energy sensors, or pyroelectric sensors, designed to measure repetitive pulse energies and average powers at pulse rates up to 25000 pulses per second, and pulse widths up to 20ms. These sensors use a pyroelectric crystal that generates electric charges that are proportional to the pulse energy.

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TEST AND MEASUREMENT EQUIPMENT VIDEOS

  • What Wavelength Range Should You Use?
    What Wavelength Range Should You Use?

    At Photonics West 2017, Greg Staples focused on selecting different wavelengths for specific applications. Watch the video for wavelength selection guidance for precision agriculture, food sorting, mining, pharmaceutical quality control, and more.

  • Product Video: Surface Metrology In Adverse Environments
    Product Video: Surface Metrology In Adverse Environments

    This year at Photonics West, Erin McDonnel and Eric Felkel with Zygo gave us a glimpse into how their interferometers can be used to perform accurate surface metrology in adverse environments (like a trade show floor).

  • Co-alignment Of Visible, NIR, And IR Laser Beams
    Co-alignment Of Visible, NIR, And IR Laser Beams

    Eric Craven with Ophir Photonics provided us with a tutorial at DCS 2016 on how to co-align visible, near-infrared, and infrared laser beams through the use of a pyroelectric camera array coupled with beam profiling software.

  • An Intro To Advanced Hyperspectral Imaging
    An Intro To Advanced Hyperspectral Imaging

    Hyperspectral imaging technology has advanced significantly in the last 50 years, and Greg Staples with Bayspec talked with us for a few minutes at the 2016 SPIE DCS exhibition about how it has changed.

  • Measurements Across A Wide Spatial Frequency Domain
    Measurements Across A Wide Spatial Frequency Domain

    At Zygo' booth this year, Tyler Steele introduced us to the Verifire™ series of interferometers for the measurement of plano, spherical and aspherical surfaces and material characteristics. He then turned it over to Eric Felkel who showed us the Nomad™, a portable optical profiler for measuring topography and roughness on optical surfaces.

  • Why Do I Need To Measure My Laser Beam?
    Why Do I Need To Measure My Laser Beam?

    Dan Ford walked us through some of what was on display for laser beam profiling and analysis applications before sharing information on Ophir’s high-power laser application initiative over the last year.

  • Surface Measurements In The Most Challenging Environments
    Surface Measurements In The Most Challenging Environments

    In this video, one of Zygo’s applications engineers provides a demonstration of the ZeGageTM 3D optical surface profiler as it measures the roughness of the surface of a sealing valve used in the automotive industry. That might sounds fairly unremarkable, but check out how the system does on a rickety plastic table in a machine shop full of noise and vibration.

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