High-Performance Photodetectors For Advanced Microscopy

Opto Diode’s AXUV series photodetectors are engineered for high-performance detection of high-energy particles such as electrons and X-rays, making them ideal for advanced microscopy and scientific instrumentation. With a detection range from 5 to 200 nm, these devices offer exceptional sensitivity to soft X-rays and Vacuum Ultra Violet (VUV) wavelengths. Their low dark current, fast response times, and excellent linearity ensure precise and reliable measurements even in challenging high-vacuum environments.

In electron microscopy applications—such as SEM and TEM—the AXUV detectors are widely used for backscatter electron detection and beam alignment. Their fully depleted silicon design and thin entrance windows enhance charge collection efficiency, improving image contrast and signal monitoring accuracy. Designed to meet the needs of demanding industrial and research environments, many models come in compact, windowless packages to further optimize transmission.

These detectors are also suited for use in synchrotron beamlines, electron spectrometers, and tools for surface science and materials research. Opto Diode offers models in various active area sizes, including segmented and circular layouts for spatial sensitivity and application-specific integration. Examples include the AXUV63HS1-CH and AXUV100G, both with 0.26 A/W responsivity at 10 nm.

Built in the USA and rigorously tested for reliability, AXUV photodetectors support both standard and customized configurations. Their design flexibility, precision performance, and compatibility with high-vacuum, high-energy systems make them an essential tool for scientists and engineers working at the cutting edge of microscopy and particle detection.