TECHNOLOGIES TO SEE AT SPIE PHOTONICS WEST 2018

• Linear Variable VIS NIR Bandpass Filters For Hyperspectral Imaging

  Hyperspectral imaging (HSI) is used for many applications including satellite imaging and air reconnaissance. HSI is usually executed with bulky hyperspectral-imaging cameras that are sensitive to misalignment, very expensive, and use prisms or gratings as dispersive elements. An alternative method of HSI is the combination of linear variable bandpass filters (LVBPFs) with silicon detectors. This allows for very compact, robust, and affordable HSI detectors that offer several advantages over conventional approaches.

• Compact, All-In-One LED Luminaire Measurement System: FluxGage

  The FluxGage is Ophir’s new compact measuring system for LED Luminaires that measures their total flux, color (CCT, CRI, Duv, chromaticity), and flicker. The system measures the total flux using solar panels instead of an integrating sphere, delivering the same functionality in one-third the size. 

• Space, Satellite, and Astronomy Filters and Coatings

  Iridian Spectral Technologies offers filters and coatings for satellites and LEO instrumentation, including large format filters for astronomical observations (single band and multi-band pass filters), light absorbers/black coatings, dichroic mirrors and beam-splitters, and multi-element arrays.

• MHK C-Shape Stainless Steel Mirror Holders

  OptoSigma provides MHK C-shaped stainless steel mirror holders designed for 12.7 mm dichroic mirrors and beamsplitters. The holders feature high-resolution adjustment, and a knob-less design that is suitable for system integration.

• Compact sCMOS Camera pco.panda 4.2

  PCO introduces its latest camera innovation: the pco.panda 4.2, a state-of-the-art sCMOS camera featuring the same compact 65 x 65 x 65 mm dimensions. This camera provides outstanding quantum efficiency, up to 80%, and excellent image quality provided by the 16-bit sCMOS sensor.

• Nexview™ 3D Optical Surface Profiler

  The Nexview™ 3D optical profiler microscope stands out amongst competitive products by its ability to measure the topography of virtually any surface, irrespective of roughness, large steps and segments, thin films, steep slopes, with feature heights ranging from < 1 nm up to 20000 µm. It does all this in 3D, without contact, and provides the best qualities of other profiling technologies (stylus, confocal, focus scanning) without their limitations.