Mad City Labs Downloads
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Scanning In Liquid With A Tuning Fork Probe And Diving Bell Kit
9/29/2020
This application note describes how to
prepare a probe for an AFM scan in liquids using a tuning fork probe. The note describes how the process utilizes a “diving bell” approach to protect the probe and how to fabricate the diving bell using the Mad City Labs diving bell kit . -
AFM With Motorized XYZ And Camera
9/29/2020
An atomic force microscope (AFM) can be built using Mad City Labs products along with other off-the-shelf components. This application note describes the construction of a fully automated AFM with the addition of a camera with
a coaxial illuminator to view the tip approach . -
AFM With Manual XY And Automated Z Approach And Camera
9/29/2020
An atomic force microscope (AFM) can be built using Mad City Labs products along with other off-the-shelf components. This application note describes the construction of a
n AFM automated Z approach with the addition of a camera with a coaxial illuminator to view the tip approach. -
SPM-M Kit For Scanning Probe Microscopy Brochure
9/28/2020
The SPM-M kit is a do-it-yourself atomic force microscope (AFM). The SPM-M kit produces a high performance, resonant probe AFM suitable for both research and teaching environments. It includes the MadPLL® controller, 3 axes of closed loop nanopositioning, resonant probes and AFMView™2 software. A wide range of AFM accessories are also available.
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Implementing A Diving Bell On A Resonant Probe AFM/NSOM
8/27/2020
Imaging live cells or other soft samples in a liquid buffer is uniquely challenging, but the diving bell technique can preserve both high Q factor and sample integrity.
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Understanding Virus Mechanisms — One Particle At A Time
7/8/2020
Single-molecule microscopy techniques facilitate direct study of molecular mechanisms, enabling leaps in understanding how surrounding viruses assemble, disassemble, and interact with their hosts.
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Near-Field Scanning Optical Microscopes: Capabilities And Applications
5/20/2020
NSOM techniques and instrumentation have evolved to become vital tools for material characterization, providing high-quality data and continually expanding utility.
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Resonant Probe AFM: Uses And Advantages
4/21/2020
Resonant probe atomic force microscopes’ unique construction and functionality enable them to serve in applications demanding spot-on accuracy, adaptability, and exceptionally high definition.
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Extreme Metrology: Big Science Requires A Nano-Perspective
3/5/2020
Extreme metrology applications involve more than enough unknown variables. Instrumentation whose performance has been proven should not be one of them.
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How To Specify A Custom-Designed Instrument
1/21/2020
Customers with a clear-eyed view of the solution’s basic specifications, budget, and expected timeline are well-positioned for an efficient, effective custom design experience.