Brochure | April 17, 2020

SPM-M Kit For Scanning Probe Microscopy Brochure

SPM-M Kit is designed to allow operators to build a tuning fork, Akiyama probe, AFM (atomic force microscope), or a scanning resonant probe microscope to capture high resolution imagery in both commercial and R&D applications. The kit includes a Nano-SPM200 nano-positioning stage (XY), a Nano-OP30 nano-positioning stage (Z), and a 3 axis closed loop Nano-Drive® controller, but it may also be customized by substituting any nano-positioners and pico-positioners and many additional options. For additional information, download the brochure.

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