Extreme Metrology: Big Science Requires A Nano-Perspective
Source: Mad City Labs, Inc.
By James MacKay, Ph.D. and Shannon Ghorbani, Mad City Labs
![MadCity MadCity](https://vertassets.blob.core.windows.net/image/e82b0faf/e82b0faf-b53c-4ebd-8802-bcec8a899f92/375_250-madcity.jpg)
Extreme metrology applications involve more than enough unknown variables. Instrumentation whose performance has been proven should not be one of them.
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Mad City Labs, Inc.
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