Metrology Solutions

  1. Verifire™ Laser Fizeau Interferometer
    7/28/2014

    The Verifire™ interferometer is a true common-path Fizeau configuration that ensures accurate metrology and “ripple-free” phase measurements in vibration-prone environments. It is well suited for providing accurate surface metrology in both production and quality control environments.

  2. DynaFiz™ Dynamic Laser Interferometer Interferometer
    7/28/2014

    The DynaFiz™ interferometer is a high performance laser interferometer designed to measure the surface form of optics in the presence of turbulent air, or in environments susceptible to extreme vibrations.  The system’s long life, high powered HeNe laser source enables reliable metrology at the camera’s maximum shutter speeds of cavities with low reflectivity.   This proprietary laser and optimized optical system in the DynaFiz system  allows the interferometer to “freeze” the vibration during acquisition so that dynamic metrology can be conducted in environments that are too violent for traditional temporal phase shifting.

  3. Nexview™ 3D Optical Surface Profiler
    12/4/2013

    The Nexview™ 3D optical profiler microscope stands out amongst competitive products by its ability to measure the topography of virtually any surface, irrespective of roughness, large steps and segments, thin films, steep slopes, with feature heights ranging from < 1 nm up to 20000 µm. It does all this in 3D, without contact, and provides the best qualities of other profiling technologies (stylus, confocal, focus scanning) without their limitations.