Metrology Solutions
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Nexviewâ„¢ 3D Optical Surface Profiler
12/4/2013
The Nexview™ 3D optical profiler microscope stands out amongst competitive products by its ability to measure the topography of virtually any surface, irrespective of roughness, large steps and segments, thin films, steep slopes, with feature heights ranging from < 1 nm up to 20000 µm. It does all this in 3D, without contact, and provides the best qualities of other profiling technologies (stylus, confocal, focus scanning) without their limitations.