The new Ophir® PD300-MS microscope slide power meter designed to make accurate measurements of emitted light from fluorescent microscopes. Measuring power levels of high numerical aperture (NA) objectives, from 5 µW to 1 W, this power meter can be used with a wide range of light sources in such applications as photo-activation or photo-bleaching.
FLIR offers the Duo™ Pro R high-resolution thermal and visible light imager specifically designed for commercial, industrial, and public safety applications. This HD camera features a dual-sensor with high-definition 4K color and thermal video recording in a single package. With a full suite of on-board sensors, the fully integrated camera provides a source for all vital data needed to create accurate maps and 3D models from an airborne platform.
Zygo Corporation introduces the next generation of optical profiling instruments designed to precisely measure surface area topography quickly and with ease for enhanced productivity and versatility. The Nexview NX2 instrument is based on innovative and versatile non-contact optical technologies. Ideal applications include research, precision engineering, quality control, and advanced manufacturing.
Zygo Corporation's NewView 9000 instrument is based on innovative and versatile non-contact optical technologies. Ideal applications include research, precision engineering, quality control, and advanced manufacturing.
The Ophir® Centauri is a compact, portable laser power and energy meter designed to make precise measurements of laser performance over time. This meter features a large, full-color, seven-inch touch screen for the review of visual data using a wide range of graphical display formats. The Centauri also offers advanced math functions, including density, scale factory, and normalize against baseline.
The new Ophir® Focal Spot Analyzer is a laser beam monitoring system designed to measure the focus spot and power of high power lasers in real time. Capable of measurement of focal sizes down to 35 µm and laser power from less than 1 to 400 Watts for wavelengths from 266 – 1100 nm, these analyzers are ideal for laser applications with shorter working distances.
LASER COMPONENTS designs and manufactures laser modules to fulfill specific requirements in industrial image processing applications -- a range of line lasers with a homogeneous power distribution generally used in metrology, as well as high power lasers and special housing units.
The BeamWatch® AM from Ophir® is an integrated laser measurement system created for measuring critical laser beam parameters for laser-based additive manufacturing systems. Simultaneous, real-time measurements are performed at video rates and are available for multiple profiles along the beam caustic in the camera field-of-view (FOV). These measurements include waist (focus spot) width and location, focal shift, centroid, M2 or K, divergence, beam parameter product, Rayleigh length, absolute power, and tilt angle measurements.
FLIR offers the new ETS320 affordable, non-contact thermal measurement system designed to collect accurate, reliable data in seconds and analyze it quickly for electronics testing and scientific research. The system pairs a high-sensitivity infrared camera with an integrated stand for hands-free measurements of printed circuit boards and other small electronics.
The Surface Reflectance Analyzer RA-532H is designed to measure and evaluate objects' surface conditions. Utilized measurement methods include standard compliant gloss, haze, Image Clarity (IC), and 2-D BRDF (Bidirectional Reflectance Distribution Function) measurements.
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