Ophir Photonics News
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MKS Announces Ophir® Integrating Spheres For Accurate, Repeatable Measurement Of Optical Power In VCSELs
2/13/2019
MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced at SPIE Photonics West the Ophir® IS6D integrating spheres for measuring the optical power of widely divergent laser diode sources, such as VCSELs. Part of the Ophir Integrating Spheres series of products, the new spheres can accurately measure light that diverges up to ±85 degrees. Each sphere is delivered as a calibrated unit with a photodiode detector.
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MKS Announces Ophir® BeamWatch® Integrated, Fully Automated Beam Monitoring System For Industrial Production Environments
2/13/2019
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced at SPIE Photonics West Ophir® BeamWatch® Integrated, a fully automated, non-contact laser measurement system designed to measure critical beam parameters in industrial production environments. A rugged, compact, self-contained system, BeamWatch Integrated measures parameters of the focused beam in real-time, including focus spot size, beam caustic, and absolute power readings. The system can accommodate different types of welding heads and includes a variety of interfaces, such as PROFINET and Ethernet/IP, for integration into production networks and automated manufacturing lines to facilitate direct transfer of measurement data.
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MKS Announces Ophir® Fast Photo Diodes For High Speed Measurement Of Pulsed Lasers And VCSELs
2/6/2019
MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced at SPIE Photonics West the Ophir® Fast Photo Diodes, high speed, biased PIN photodiode detectors for viewing and measuring pulsed lasers and VCSELs. The detectors use the photovoltaic effect to convert fast optical pulses into electrical signals. They are available in a variety of configurations that cover the spectrum from 190nm to 1700nm. Rise times and fall times are fast, ranging from as low as 25ps. Bias voltage is supplied by internal batteries and/or external power supply, depending on the model.
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MKS Announces Ophir® LP2 Power/Energy Sensor With Very High Damage Threshold For High Power Density And Long Pulse Lasers
10/2/2018
MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced the L50(150)A-LP2-35, the newest addition to the Ophir® line of LP2 laser power/energy sensors with high damage threshold. The L50(150)A-LP2-35 is a compact, thermal measurement sensor for use with high power density and long pulse lasers. It features an LP2 coating that provides the highest damage threshold in the industry, 33kW/cm2 at full CW power of 150W power. The coating also reduces reflection, absorbing 95% at most wavelengths, and is spectrally flat at ±1% from 0.25µm to 2.2µm.
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MKS Announces New Ophir® FluxGage™ Measurement System For Large-Size Street And Industrial LED Luminaires
9/11/2018
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, announces the Ophir® FluxGage™ FG1500, the newest member of the FluxGage family of compact measurement systems for LED luminaires. The FG1500 features an aperture size of 144 x 64cm, allowing for photometric measurement of large-size street and industrial luminaires, LED flat panels, and troffer lights.
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MKS Announces New Ophir® NanoScan™ Scanning Slit Laser Beam Profilers for Sub-Micron Measurement of Tunable Lasers and Mid IR Lasers
8/15/2018
MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced new additions to the Ophir® NanoScan™ 2s line of high power, scanning slit laser beam profilers. NanoScan products are NIST-calibrated profilers that instantly measure beam position and size with sub-micron precision for CW and kilohertz pulsed lasers. NanoScan profilers offer a choice of silicon, germanium, or pyroelectric detectors, which allows profiling lasers of any wavelength, from UV to far infrared, to 100μm and beyond.
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MKS Announces New Ophir® High Resolution Beam Profiling Camera With GigE Interface For High-Speed Applications
7/31/2018
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the new Ophir® SP920G GigE Silicon CCD High Resolution Camera designed specifically for industrial laser beam profiling applications.
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Ophir® Photonics Receives ISO/IEC 17025 Accreditation Ensuring Highest Accuracy NIST-Traceable Measurements From The Company's Laser Measurement Products
6/26/2018
MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, is pleased to announce that Ophir® Photonics has received ISO/IEC 17025 accreditation for its Jerusalem, Israel Calibration Laboratory. ISO/IEC 17025 is given to calibration laboratories who have achieved the highest standards of quality, administration, and technical operations.
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New Ophir® PD300-MS Power Meter For Fluorescence Microscopy Measures High NA Microscope Objectives
5/23/2018
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the Ophir® PD300-MS microscope slide power meter for accurate measurements of light emitted from fluorescence microscopes. The PD300-MS measures power levels of high numerical aperture (NA) objectives, from 5µW to 1W. A special filter provides low angular dependence, enabling higher accuracy measurements. NIST-traceable calibration allows for measurement of wavelengths from 350nm to 1100nm. The power meter is designed for use with a wide range of light sources in such applications as photoactivation or photobleaching. To accommodate limited space, it has the same footprint as a standard microscope slide. The PD300-MS can be used at the sample plane in air or with water/oil immersion objectives without damage.
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MKS Announces Ophir® Centauri, Portable Laser Power / Energy Meter With Sophisticated Graphical Display And Advanced Math Functions
2/20/2018
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the Ophir® Centauri at Photonics West 2018, a compact, portable laser power / energy meter for precise measurements of laser performance over time. The Centauri features a large, full-color, seven-inch touch-screen for visual review of data using a wide range of graphical display formats, such as Digital with Bargraph, Pulse Chart, and Real Time Statistics Displays. Advanced math functions include Density, Scale Factor, and Normalize Against Baseline.