10.08.24 -- Quantum Leap in Imaging: Exploring Nitrogen Vacancy Magnetometry and Atomic Force Microscopy

Scanning NV magnetometry commonly is applied in two different ways. The first type of measurement, called a pulsed measurement, is extremely sensitive but very slow. Continuous wave (CW) scanning NV magnetometry, meanwhile, is less sensitive but is relatively fast, recording a single data point within a few seconds.

Atomic force microscopes (AFMs) are versatile tools for characterizing surfaces down to the subnanometer scale. Researchers can build their own AFMs for as little as $30,000 using off-the-shelf components such as nanopositioning stages.

Resonant probe atomic force microscopes’ unique construction and functionality enable them to serve in applications demanding spot-on accuracy, adaptability, and exceptionally high definition.

NV centers are powerful research tools in fields from biology to material science, where researchers exploit the quantum properties of the center’s electron to enhance its sensitivity to magnetic and electric fields, as well as temperature. Using an NV Center, these properties can be measured optically and at ambient conditions.

Explore the world of nanoscale structures with atomic force microscopy (AFM) as it goes beyond imaging, delving into nanomechanical characterization. From probing friction forces to nano-manipulation, AFM integrates seamlessly with optical microscopy techniques, enhancing the nanoscopy toolkit for diverse scientific applications.

Through a deep knowledge of sensing technologies, technically adept personnel, and experience across a bevy of applications, Mad City Labs helps our customers operate smaller and more cost-effectively than any competitor. We want you to say, “show me what you have done,” and “tell me how you can make this work for my application.”

The QS-PLL is an atomic force microscope (AFM) controller designed for use with resonant probes, such as tuning forks, and Mad City Labs nanopositioners and micropositioners. The controller integrates motion control and phase lock loop (PLL) control thus streamlining the hardware interface.

The SPM-M kit is a do-it-yourself atomic force microscope (AFM). The SPM-M kit produces a high performance, resonant probe AFM suitable for both research and teaching environments. It includes the MadPLL® controller, 3 axes of closed loop nanopositioning, resonant probes and AFMView™2 software. A wide range of AFM accessories are also available.