SPM-M Kit For Scanning Probe Microscopy

SPM-M Kit For Scanning Probe Microscopy

Scanning probe microscopy is an imaging technique typically used for industrial wear testing, semiconductor manufacturing, or academic research applications. While it can yield high-resolution imagery, SPM systems can be rather expensive and take skill to build. Mad City Labs' SPM-M kit has been designed to allow operators to build a tuning fork, Akiyama probe, AFM (atomic force microscope), or a scanning resonant probe microscope to capture high resolution imagery in both commercial and R&D applications.

The SPM-M kit is comprised of the following:

  • MadPLL® Instrument Package
    • digital phase lock loop (PLL) controller
    • probe mounting boards
    • five quartz tuning forks
  • Nano-SPM200 nanopositioning stage (XY)
  • Nano-OP30 nanopositioning stage (Z)
  • 3 axis closed loop Nano-Drive® controller
  • Z axis open loop/close loop switch (OCL option)
  • AFMView™ Software
  • AFMView™ Tutorial
  • Adapter plate between probe mount board and Nano-OP30
  • Application note: "AFM Kit with manual positioning"

Watch the video below to see how simple it can be to assemble an atomic force microscope using the SPM-M kit, an Akiyama probe, manual coarse positioners, and a few pieces of additional hardware. To learn more about the MadPLL instrument, download the datasheet.

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