Scanning probe microscopy is an imaging technique typically used for industrial wear testing, semiconductor manufacturing, or academic research applications. While it can yield high-resolution imagery, SPM systems can be rather expensive and take skill to build. Mad City Labs' SPM-M kit has been designed to allow operators to build a tuning fork, Akiyama probe, AFM (atomic force microscope), or a scanning resonant probe microscope to capture high resolution imagery in both commercial and R&D applications.
The SPM-M kit is comprised of the following:
Watch the video below to see how simple it can be to assemble an atomic force microscope using the SPM-M kit, an Akiyama probe, manual coarse positioners, and a few pieces of additional hardware. To learn more about the MadPLL instrument, download the datasheet.