Scanning probe microscopy is an imaging technique typically used for industrial wear testing, semiconductor manufacturing, or academic research applications. While it can yield high-resolution imagery, SPM systems can be rather expensive and take skill to build. Mad City Labs' SPM-M kit has been designed to allow operators to build a tuning fork, Akiyama probe, AFM (atomic force microscope), or a scanning resonant probe microscope to capture high resolution imagery in both commercial and R&D applications.
Adapter plate between probe mount board and Nano-OP30
Application note: "AFM Kit with manual positioning"
Watch the video below to see how simple it can be to assemble an atomic force microscope using the SPM-M kit, an Akiyama probe, manual coarse positioners, and a few pieces of additional hardware. To learn more about the MadPLL instrument, download the datasheet.
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