06.13.24 -- Picometer Precision – Critical For Applications From Astronomy To Microscopy

Mad City Labs has demonstrated the capability to repeatably achieve a one-picometer movement with a piezo nanopositioner, and to accurately resolve that movement. Not every experiment requires a device capable of taking a single picometer step, but many applications require high precision, including atomic force microscopy and large baseline measurements.

Navigating the complexities of nanopositioning systems' specifications can be daunting. Understanding what matters to your application requires more than just reading datasheets. Let's delve into how to confirm and interpret these specifications for real-world performance.

Mad City Labs' Shannon Ghorbani details how extreme metrology applications, from long baseline interferometry to atomic force microscopy, benefit from picometer-scale resolution. Learn why minimizing position noise is crucial and how Mad City Labs can enhance your setup, regardless of scale.

Extreme metrology, essential for cutting-edge scientific research, demands unparalleled precision and expertise. From NASA to NIST, scientists rely on specialized instrumentation to achieve near-impossible feats. Partnering with knowledgeable suppliers ensures these projects succeed and push the boundaries of what is technologically possible.

Every nanopositioner has a small amount of uncertainty in its position that contributes noise to a measurement. From black hole collisions to atomic force microscopy, uncover how understanding noise at the sub-nanometer scale ensures precision in every application.

The Nano-MTA Series are piezo nanopositioning mirror tip/tilt actuators. With nanoradian resolution, the Nano-MTA Series is ideal for applications involving laser beam steering, tracking, and scanning. Proprietary PicoQ® technology provides absolute, repeatable position measurement under closed-loop control.

The Nano-METZ is a compact z-axis piezo nanopositioning system designed for high speed scanning and ultra-low noise characteristics for demanding AFM, positioning, and metrology applications. The innovative design of the Nano-METZ and our exclusive PicoQ® sensor technology yields a resonant frequency of 14.5 kHz and a noise floor of 400 femtometers/√Hz.