Industry Insights
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The Calibration Process
10/2/2025
Explore instruments that offer NIST-traceable calibration using Gold Standards and PWCTM for ±1% total accuracy, ensuring reliable, comparable, and regulation-compliant laser measurements.
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Extra-Terrestrial Connections: Enabling Optical Mesh Networks In Orbit
9/24/2025
Optical filter implementation into orbital mesh networks must consider how price, performance, and delivery timeline can be optimized together to align with specific customer needs.
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Overmolding: The Basics For Successful Optical Manufacturing
9/24/2025
Optical micro overmolding combines micro molding with lead-frame or insert processes to achieve precision, clarity, and integration, demanding early collaboration to ensure manufacturability, performance, and cost efficiency.
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Advantages Of Multiple Band Pass Filters In Telecommunications Applications
9/23/2025
Multi band filters help optimize price-performance balance while also conserving space, simplifying design, and improving (or offering equivalent) performance versus single band filters.
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Improved Fluorescence Detection Performance
9/17/2025
Discover how Semrock Avant™ optical filters enhance fluorescence imaging of small Stokes Shift probes by providing steeper edges, reduced variation, and stronger blocking.
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Emission Filters For Single-Point Measurements
9/17/2025
Fluorescence detection requires precise filter selection. High OD blocking and proper excitation–emission alignment minimize noise, crosstalk, and aberrations, ensuring accurate measurements.
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What's Your Spectral Challenge?
9/17/2025
SearchLight™ is a free, intuitive online tool that streamlines fluorophore and filter selection, enabling users to model, optimize, and share fluorescence system designs with confidence and efficiency.
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Precision IR Emitters And Detectors For Gas Analysis And Monitoring
9/10/2025
Environmental sensing demand is growing. Opto Diode’s IR emitters and PbS/PbSe detectors enable precise, compact, and reliable gas analysis for medical, industrial, and environmental monitoring applications.
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Driving Innovation In Semiconductor Lithography And Metrology
9/4/2025
Discover industry-leading UV and EUV photodiodes engineered for semiconductor lithography, metrology, and inspection, pairing high sensitivity, reliability, and customized solutions for demanding applications.
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Measuring Scanning Motion Flatness With AFM
9/2/2025
Learn how scanners used for high resolution metrology measurements should be designed and tested for flatness of motion, particularly for atomic force microscopy (AFM).