1. High Precision XYZ Piezo Stage For Super-Resolution Microscopy: P-545 PInano® II

    PI offers the new P-545 2nd generation PInano® high-resolution XY/XYZ multi-axis positioning system with higher linearity, simple operation, and easier access to advanced features in comparison to conventional analog piezo controllers. This PInano® II device features an easy-to-integrate low profile (20 mm), a long travel distance of 200 µm, and millisecond step time, making it ideal for super-resolution microscopy and imaging applications.

  2. Surface Reflectance Analyzer: RA-532H

    The Surface Reflectance Analyzer RA-532H is a device designed to comprehensively measure and evaluate the surface conditions of objects. Utilized measurement methods include standard compliant gloss, haze, Image Clarity (IC), and 2-D BRDF (Bidirectional Reflectance Distribution Function) measurements.

  3. Low Reflection And Non-Glare Glass Solutions

    Abrisa Technologies now offers an extended range of standard stock non-glare (NG), anti-reflection (AR), and anti-reflection coated non-glare (NG/AR) glass and custom solutions, ready to be fabricated to exact specifications. These three options are available for the display designer and integrator to best suit the needs for reduced reflection and glare, throughput efficiency for display brightness, and maintaining image quality.

  4. Chemically Strengthened Glass For Displays, Sensors, And Scanners: AGC Dragontrail™

    Abrisa Technologies now offers the innovative High Ion-Exchange (HIE™) Asahi Glass Corporation (AGC) Dragontrail™ aluminosilicate glass for cover glass, display, sensor, and scanner technologies. Dragontrail supports low profile, reduced weight, portable field, and industrial devices with a toughness of 6x that of soda lime float. It is designed to enhance the usable lifetime of high contact touch displays, and industrial image sensors, document scanners, and on board vehicular and avionics displays.

  5. Alkali Free Boro-Aluminosilicate Glass

    Highly transmissive, thin, alkali-free, boro-aluminosilicate glass from Asahi Glass Corporation (AGC) is designed for use in highly sensitive bio-photo detection applications, high throughput sensor applications, as enhancement glass for thin displays, and as cover glass for micro arrays.

  6. Diffractive Optical Elements (DOEs) For Beam Splitting

    Diffractive optical elements (DOEs) from LASER COMPONENTS are designed to be used as multi-spot beam splitters in beam shaping, and beam profile modifications with lasers and high power lasers. Using diffractive elements for beam splitting is advantageous in the instance of needing one element to produce several beams, or when very exact power separation is required. DOEs can also achieve precise positioning to create holes at clearly defined and accurate distances.

  7. Silicon Avalanche Photodiode (APD) Arrays

    LASER COMPONENTS offers Silicon Avalanche Photodiode (Si APD) Arrays for applications in LIDAR and ACC within the 800 to 900 nm wavelength range. The SAH series of Si APD arrays are typically used in Time-of-Flight (TOF) sensors for distance measurements, such as in automotive sensing applications.

  8. Very High Power Water-Cooled Thermal Sensor: 15K-W-BB-45

    Ophir Photonics’ new 15K-W-BB-45 is a high damage threshold sensor designed to measure continuous laser power from 100 W to 15,000 W over the spectral range from 0.8 to 2 µm and 10.6 µm. This compact, water-cooled, thermal laser power measurement sensor features a deflecting cone and annular absorber that tolerates high power densities up to 10 kW/cm2.

  9. 0-60 Degree Polarization Optimized Anti-Reflection (AR) Coatings

    Abrisa Technologies provides very wide angle anti-reflection (AR) coatings for p-plane and s-plane polarization. These coatings support high throughput efficiency for broad angle polarization sensitive applications.  

  10. BeamCheck™ Beam Profiling System For Additive Manufacturing

    The Ophir Photonics BeamCheck™ beam profiling system is designed specifically for measuring critical laser beam parameters in laser-based additive manufacturing systems. A CCD camera is used for spatial measurements, and an NIST-traceable power sensor is utilized to provide a complete analysis of laser power density profiles.