Technical Articles

  1. The Instrument Transfer Function
    8/14/2017

    An interferometer is a common instrument for measuring optical surfaces to very high precision that can be applied with care to enable extremely low uncertainty measurements to address tight metrology requirements. The ability of an interferometer to quantify mid-spatial frequency content is defined not only by its sampling density (camera resolution), but also by the many critical design aspects of the optical illumination and imaging system. The instrument transfer function (ITF) quantitatively characterizes the response of the instrument as a function of spatial frequency.

  2. Selecting A Hyperspectral Imager To Bring Critical Data Into View
    8/10/2017

    The hyperspectral imager comes with challenges, not the least of which is choosing the right one to use for any given application. That decision depends in part on the user’s requirements, the wavelength range in which the imager will be used, and the intended application.

  3. Fiber Optic Sensing
    8/9/2017

    The two types of sensing include local measurement points and distributed sensing. This paper presents the technical basics behind sensing over fiber technologies, its main applications, and the cabling solutions involved.

  4. Understanding LIDT Laser Optics For High Power Lasers
    8/4/2017

    To analyze the specific damage characteristics of high-power laser optics, it is important to understand the laser induced damage threshold (LIDT), an analytical threshold determination method that can reveal damage diagnostics, and its testing provides a lower-cost option for coating development. 

  5. Why SWIR And InGaAs Are Useful
    8/4/2017

    Sensing in the shortwave infrared (SWIR) range (wavelengths from 0.9 to 1.7 microns) has been made practical by the development of indium gallium arsenide (InGaAs) sensors. This white paper covers the importance of using InGaAs technologies in SWIR applications.

  6. Understanding Latency In Real-Time Imaging Systems
    8/4/2017

    Latency performance data helps imaging system designers determine how quickly a system can process, analyze, and, in some applications, display images. This paper discusses the constituent elements of latency and delivers latency test results for image transfer over a GigE Vision link.

  7. Considering High Dynamic Range Global Shutter CMOS Sensors
    7/25/2017

    CMOS Image sensors with a global shutter(GS)  - used to avoid image degradation caused by rolling shutter (RS) distortion - are ideal for applications including factory automation, UAVs, and automobile advanced driver-assistance systems (ADAS). 

  8. Understanding The Dynamics Of Droplets And Turbulence
    7/20/2017

    Turbulent flows laced with particles can be found everywhere, and include fuel droplets in combustion engines, airborne pollen, and water droplets in clouds. Even though they have been studied often, questions still remain that have to do with the particles’ inertia prohibiting them from following turbulence flow, making the Navier-Stokes equations insufficient for solving their equations. This white paper presents a project studying the dynamics of inertial droplets in a turbulent flow in a well-controlled environment. Measurements of droplet size distribution and turbulent dispersion rate in this study are done with interferometric particle imaging (IPI) and phosphorescent tagging techniques.

  9. 3-D Machine Vision: One Small Step For Robots, A Giant Leap For Factory Automation
    7/18/2017

    3-D machine vision systems “see,” analyze, and make decisions to meet production requirements of high accuracy, speed, and low maintenance while also being durable enough to withstand factory conditions.

  10. The Evolution Of Ultrafast, Ultra-Precise Beam Steering Techniques For Micro-Material Processing
    7/18/2017

    When designing micromaterial processing equipment, manufacturers need to consider a complex interplay of factors, such as accurate positioning of lasers for cutting, drilling, scribing, or  marking at the highest rate possible. In many integrated circuits, the required beam accuracies can be staggering.