05.12.26 -- Resonant probe AFM enables material characterization for devices and quantum materials

Shrinking electronics require precise thermal management. Since conventional methods lack sufficient resolution to analyze densely packed semiconductors, Scanning Probe Thermoreflectance Microscopy (SPTRM) has emerged as a vital solution. It provides sub-100 nm resolution, enabling detailed thermal imaging of nanometer-scale features that older techniques cannot capture.

Resonant probe atomic force microscopes offer a unique combination of precision, adaptability, and ultra-high resolution. Their advanced design enables highly accurate surface measurements, making them ideal for applications requiring nanoscale detail, reliable performance, and the ability to analyze complex materials across fields.

Scanning NV magnetometry commonly is applied in two different ways. The first type of measurement, called a pulsed measurement, is extremely sensitive but very slow. Continuous wave (CW) scanning NV magnetometry, meanwhile, is less sensitive but is relatively fast, recording a single data point within a few seconds.

The Near-Field Scanning Optical Microscope (NSOM) has garnered renewed interest despite past underutilization. This article explores NSOM's evolution, functionality, and diverse applications. From Mad City Labs' innovative systems to advanced methodologies, discover how NSOM augments material characterization and enables high-resolution imaging in various research domains.

The SPM-M kit is a do-it-yourself atomic force microscope (AFM). The SPM-M kit produces a high performance, resonant probe AFM suitable for both research and teaching environments. It includes the MadPLL® controller, 3 axes of closed loop nanopositioning, resonant probes and AFMView™2 software. A wide range of AFM accessories are also available.