Newsletter | May 21, 2025

05.21.25 -- Reconstructing The Pyramids With Modern Metrology, How To Read Optical Data Sheets & Much More

The Role Of Metrology In Reconstructing The Giza Pyramids

Modern metrology – GNSS, laser scanning, BIM, and automation – would enable precise and efficient rebuilding of the Giza pyramids far faster and with fewer resources.

SPOTLIGHT ON METROLOGY

New Metrology Techniques For Advanced Thin Film Optical Filters

Measuring the spectral response of advanced thin film optical filters is challenging, but can be overcome with the right approach.

Metrology Has Deep Roots

Explore how metrology, intertwined with technological leaps, has become indispensable across diverse industries, shaping the landscape of modern innovation.

INDUSTRY INSIGHTS

How To Read Optical Data Sheets

Unlock the power of optical data sheets. Learn to decipher Gaussian data, distortion, spectral transmission, MTF, and more to make informed decisions in industrial imaging applications.

Thales Receives Custom 10PW Beam Dump For World's Most Powerful Laser

By collaborating with Gentec-EO and their distributor Laser Components, see how Thales was able to gather the necessary specifications and requirements for this project.

Extreme Metrology: Big Science Requires A Nano-Perspective

Extreme metrology applications involve more than enough unknown variables. Instrumentation whose performance has been proven should not be one of them.

Using Optical Filters To Optimize Illumination In Fluorescence And Raman Systems

Semrock offers fluorescence filters for various light sources. They help optimize excitation and reduce background noise in fluorescence spectroscopy, photometry, and microscopy.

RECENT NEWS

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First Production-Ready TFLN Photonic Foundry Emerges From CSEM Spin-Off

UK's Laser Facility Achieves First Light With £17M Project

Jenoptik Presents Optical System For Efficient Laser-Based Solar Cell Processing

Semiconductor Light Sources For Quantum Communication & Computing

VIGO Photonics PCO S.A. Enter Agreement For Advanced Infrared Detector Development

New Perovskite Design Sets Solar Cells On Path To Stability

BULLETIN BOARD

Detector Solutions For EUV/DUV Lithography And Metrology

Opto Diode Corporation is a trusted partner in the semiconductor industry, supporting leading companies in DUV and EUV photolithography and metrology applications.

Surface Reflectance Analyzer Allows Instant Analyzation Of Almost Any Material Surface

The RA-532H is the industry's first portable Surface Reflectance Analyzer that instantly analyzes nearly any material and visualizes results for four key surface conditions.

FEATURED SOLUTIONS

Insert Micromolding

Thin & Ultra-Thin Lightweight Mirrors

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