Ellipsometers
Source: HORIBA Jobin Yvon
Spectroscopic ellipsometer allows the accurate characterization of a range of properties including the layer thickness, optical constants, composition, crystallinity, anisotropy, and uniformity...
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•Brochure: Spectroscopic Ellipsometry
•Brochure: Liquid Crystal Modulation Spectroscopic Ellipsometer
•Brochure: PZ2000 - Automatic Laser Ellipsometer/Reflectometer Measurement Of Thickness, Refractive Index And Reflectivity Ellipsometer
Spectroscopic ellipsometer allows the accurate characterization of a range of properties including the layer thickness, optical constants, composition, crystallinity, anisotropy, and uniformity. Thickness determinations ranging from a few angstroms to tens of microns are possible for single layers and complex multilayer stacks.
•Brochure: Spectroscopic Ellipsometry
•Brochure: Liquid Crystal Modulation Spectroscopic Ellipsometer
•Brochure: PZ2000 - Automatic Laser Ellipsometer/Reflectometer Measurement Of Thickness, Refractive Index And Reflectivity Ellipsometer
•Brochure: Spectroscopic Ellipsometry
•Brochure: Liquid Crystal Modulation Spectroscopic Ellipsometer
•Brochure: PZ2000 - Automatic Laser Ellipsometer/Reflectometer Measurement Of Thickness, Refractive Index And Reflectivity Ellipsometer
Spectroscopic ellipsometer allows the accurate characterization of a range of properties including the layer thickness, optical constants, composition, crystallinity, anisotropy, and uniformity. Thickness determinations ranging from a few angstroms to tens of microns are possible for single layers and complex multilayer stacks.
Click Here To Download:
•Brochure: Spectroscopic Ellipsometry
•Brochure: Liquid Crystal Modulation Spectroscopic Ellipsometer
•Brochure: PZ2000 - Automatic Laser Ellipsometer/Reflectometer Measurement Of Thickness, Refractive Index And Reflectivity Ellipsometer