Download | July 10, 2006

Brochure: PZ2000 - Automatic Laser Ellipsometer/Reflectometer Measurement Of Thickness, Refractive Index And Reflectivity

Source: HORIBA Jobin Yvon
The PZ2000 is an automatic thin-film measurement system for substrates of up to 300 mm diameter. Based on the technique of ellipsometry and reflectometry, the tool is capable of determining the thicknesses, refractive index, absorption constants and reflectivity of thin films from 0 nm up to several microns.
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