Newsletter | July 7, 2025

07.07.25 -- Atomic Spectroscopy: New Technologies And What's Next

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SPIE Optifab 2025

SPIE Optifab October 20-23, 2025 USA 
www.spie.org/ofb

FROM THE EDITOR

Atomic Spectroscopy: New Technologies And What's Next

Atomic spectroscopy is advancing with the integration of AI, enhanced portability, and increased sensitivity, reshaping research and industry with faster, more precise, and field-ready analysis.

SPOTLIGHT ON SPECTROSCOPY

NIR & SWIR Spectroscopy For Light Investigation And Spectral Analysis

NIR/SWIR spectroscopy using InGaAs sensors enables precise spectral analysis for minerals, organics, and biological materials, offering non-invasive insight across scientific applications.

INDUSTRY INSIGHTS

Choosing Between Active and Passive Methods for Enhanced Efficiency

Passive alignment limits scalability, while active alignment offers superior precision and flexibility. Advanced systems now enable rapid, automated alignment for high-yield, cost-effective production.

Implementing A Feedback Control Loop To Monitor Laser Power

Explore how implementing a feedback control loop to monitor laser power in automotive manufacturing ensures precise laser welding and contributes to preventing costly assembly line disruptions.

Near-Field Scanning Optical Microscopes: Capabilities And Applications

NSOM techniques and instrumentation have evolved to become vital tools for material characterization, providing high-quality data and continually expanding utility.

Alluxa Launches HELIX System for Thin-Film Optical Filter Analysis

The HELIX Spectral Analysis System has redefined measurement capabilities of high performance thin-film optical filters.

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FEATURED SOLUTIONS

Spectral Plotting & Analysis Tool: SearchLight

SearchLight is a free, intuitive, online plotting tool helps you overcome the obstacles many fluorescence instrument designers and users face with spectral management.

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