Application Note

Alluxa Introduces HELIX™ Spectral Analysis System For Measuring High-Performance Thin-Film Optical Filters

Source: Alluxa, Inc.

By Alannah Johansen, et al.

The HELIX Spectral Analysis System has redefined measurement capabilities of high performance thin-film optical filters. HELIX is an instrument designed and developed by Alluxa Engineering staff to address the limitations of most commercially available spectrophotometers.

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