05.16.23 -- Spotlight On Force Microscopy And Nanoscopy

The construction and functionality of resonant probe atomic force microscopes make them ideal for applications where precise accuracy, adaptability, and high definition are required.

Scanning NV magnetometry commonly is applied in two different ways. The first type of measurement, called a pulsed measurement, is extremely sensitive but very slow. Continuous wave (CW) scanning NV magnetometry, meanwhile, is less sensitive but is relatively fast, recording a single data point within a few seconds.

The use of NSOM techniques and instrumentation has become essential for material characterization, offering reliable data and diverse applications.

Every nanopositioner has a small amount of uncertainty in its position, contributing noise to a measurement. It's essential to understand what position noise is and where it comes from to know just how accurate the nanopositioner is.

AFMs are useful for studying surfaces on a sub-nanometer scale. Scientists can make their own AFMs with off-the-shelf components, costing as little as $30,000.