Newsletter | November 12, 2026

11.12.26 -- Picometer Positioning For Metrology, Microscopy And Quantum Sensing

Tiny Diamonds, Big Potential: NV-Center Sensor Innovations

Optical trapping uses laser light pressure to manipulate nanoscale particles and measure tiny forces. When combined with NV-center nanodiamonds, which sense magnetic fields, electric fields, and temperature, optical trapping experiments gain enhanced positioning control and multimodal sensing capabilities.

 

Demonstrating Picometer-Level Precision In Microscopy And Astronomy

Demonstrating repeatable one-picometer movement and precise measurement with a piezo nanopositioner, this technology supports high-precision applications such as atomic force microscopy and large-baseline measurements requiring exceptional positioning accuracy.

 

High Resolution Steps For Angular Displacement Using The Nano-MTA2

Demonstrates the Nano-MTA2's ability to achieve extremely small, measurable 25-nanoradian steps, enabled by the low-noise and high-resolution capabilities of PicoQ® sensors.

 

Extreme Metrology: Big Science Requires A Nano-Perspective

Extreme metrology applications involve countless unknown variables, making proven instrumentation essential. Reliable, validated equipment helps eliminate uncertainty, deliver consistent performance, and ensure accurate results in demanding measurement environments where precision is critical.

 

SOLUTIONS

Nano-METZ Nanopositioning System

The Nano-METZ is a compact, high-speed z-axis piezo nanopositioning system for demanding AFM, positioning, and metrology applications, delivering a 14.5 kHz resonant frequency and 400 femtometers/√Hz noise floor for exceptional precision.

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