Datasheet | November 4, 2015

NanoScan™ 2s Scanning Slit Beam Profiler Datasheet

Source: Ophir Photonics

The NanoScan™ 2s is designed to deliver highly accurate dimensional measurements of laser beam spatial irradiance profiles in accordance with the ISO standard 11146. This profiler uses the scanning slit technique to measure beam sizes ranging from microns to centimeters at beam powers from microwatts to kilowatts, often without attenuation. The NanoScan™ is also capable of simultaneously measuring up to 16 beams, or regions of interest, within the aperture. For more on the NanoScan™ profiler’s capabilities, benefits, and specifications, download the datasheet.