Ophir Photonics, a Newport Corporation, began making laser power meters, energy meters, and beam profilers in 1979, and we’ve never looked back. We have headquarters in the United States, Israel, Japan, and Germany, as well as distributors in over 50 countries worldwide.
We pride ourselves on two things:
precise laser measurement equipment and versatile solutions.
If you want to get the most out of your laser – most power, most efficiency, most safety – you need to measure it. And the more accurate your measurement, the closer you can come to perfection in your laser.
In the last 35 years, we’ve seen so many new types of lasers and laser applications that it would be pointless to list them here. You know them as well as we do. We take great pride (and enjoyment) in keeping up with laser development. That’s why you’ll find such a wide variety of laser measurement equipment offered here as well as a variety of accessories to make sure your laser can be measured regardless of its wavelength, power, or size.
We produce a complete line of instrumentation including power and energy meters, beam profilers, spectrum analyzers, and goniometric radiometers. Dedicated to continuous innovation in laser measurement, our patents include the R&D 100 award-winning BeamTrack power/position/size meters; BeamWatch®, the industry’s first non-contact, focus spot size and position monitor for lasers in material processing; and Spiricon’s Ultracal™, the baseline correction algorithm that helped establish the ISO 11146-3 standard for beam measurement accuracy. The Photon family of products includes NanoScan scanning-slit technology, which is capable of measuring beam size and position to sub-micron resolution.
We’re ISO/IEC 17025:2005 accredited for calibration of laser measurement instruments.
3050 North 300 West
North Logan, UT 84341
Contact: Kenneth Ferree
MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced new additions to the Ophir® NanoScan™ 2s line of high power, scanning slit laser beam profilers. NanoScan products are NIST-calibrated profilers that instantly measure beam position and size with sub-micron precision for CW and kilohertz pulsed lasers. NanoScan profilers offer a choice of silicon, germanium, or pyroelectric detectors, which allows profiling lasers of any wavelength, from UV to far infrared, to 100μm and beyond.
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the new Ophir® SP920G GigE Silicon CCD High Resolution Camera designed specifically for industrial laser beam profiling applications.
MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, is pleased to announce that Ophir® Photonics has received ISO/IEC 17025 accreditation for its Jerusalem, Israel Calibration Laboratory. ISO/IEC 17025 is given to calibration laboratories who have achieved the highest standards of quality, administration, and technical operations.
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the Ophir® PD300-MS microscope slide power meter for accurate measurements of light emitted from fluorescence microscopes. The PD300-MS measures power levels of high numerical aperture (NA) objectives, from 5µW to 1W. A special filter provides low angular dependence, enabling higher accuracy measurements. NIST-traceable calibration allows for measurement of wavelengths from 350nm to 1100nm. The power meter is designed for use with a wide range of light sources in such applications as photoactivation or photobleaching. To accommodate limited space, it has the same footprint as a standard microscope slide. The PD300-MS can be used at the sample plane in air or with water/oil immersion objectives without damage.
MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the Ophir® Centauri at Photonics West 2018, a compact, portable laser power / energy meter for precise measurements of laser performance over time. The Centauri features a large, full-color, seven-inch touch-screen for visual review of data using a wide range of graphical display formats, such as Digital with Bargraph, Pulse Chart, and Real Time Statistics Displays. Advanced math functions include Density, Scale Factor, and Normalize Against Baseline.
The new Ophir® SP920G GigE Silicon CCD High Resolution Camera is designed to capture and analyze wavelengths from 190 nm - 110 nm for industrial laser beam profiling applications. With a compact design, wide dynamic range, excellent signal to noise ratio, and a high-speed GigE (Gigabit Ethernet) interface, the camera is ideal for measuring CW and pulsed laser profiles in applications such as laser cutting of medical devices or the welding of dissimilar materials.
The new Ophir® PD300-MS microscope slide power meter designed to make accurate measurements of emitted light from fluorescent microscopes. Measuring power levels of high numerical aperture (NA) objectives, from 5 µW to 1 W, this power meter can be used with a wide range of light sources in such applications as photo-activation or photo-bleaching.
The Ophir® Centauri is a compact, portable laser power and energy meter designed to make precise measurements of laser performance over time. This meter features a large, full-color, seven-inch touch screen for the review of visual data using a wide range of graphical display formats. The Centauri also offers advanced math functions, including density, scale factory, and normalize against baseline.
The new Ophir® Focal Spot Analyzer is a laser beam monitoring system designed to measure the focus spot and power of high power lasers in real time. Capable of measurement of focal sizes down to 35 µm and laser power from less than 1 to 400 Watts for wavelengths from 266 – 1100 nm, these analyzers are ideal for laser applications with shorter working distances.
The BeamWatch® AM from Ophir® is an integrated laser measurement system created for measuring critical laser beam parameters for laser-based additive manufacturing systems. Simultaneous, real-time measurements are performed at video rates and are available for multiple profiles along the beam caustic in the camera field-of-view (FOV). These measurements include waist (focus spot) width and location, focal shift, centroid, M2 or K, divergence, beam parameter product, Rayleigh length, absolute power, and tilt angle measurements.
Measuring very low power beams of light can be tricky; even small values of noise, drift or offset can have major impact on your readings. In this video, we’ll look at some best practices that can help you get the best performance from your very low power measurements.
Scanning slit profilers can make very accurate measurements of beam diameters as small as 5 microns, while cameras are limited to beams greater than 45 microns. This makes applications for focusing lasers or building optical systems much easier with a NanoScan. This video explains how to choose the right NanoScan for your application.
On day two of Photonics West, Christian Dini with Ophir Photonics talked to us about selection criteria for choosing the right laser beam profiler. Watch the video to learn more about what to consider when selecting a beam profiling system for your application.
Christian Dini of Ophir Photonics took time at Photonics West to discuss Ophir Photonic’s non-contact BeamWatch beam profiling system, ideal for searching for focal position, focal shift, and focal size within additive manufacturing applications.
In this video, Jimmy Green, an OEM Specialist, shares how Ophir Photonics assisted a lasik surgery company replace a plastic mode burn pre-test with an accurate laser measurement device.