NanoScan High-Dynamic Range Scanning-Slit Profiler

The NanoScan scanning-slit profilers provide NIST-traceable precision and accuracy for the measurement of CW and kHz pulsed laser beams across the spectrum range from UV to far infrared. The scanning-slit technology offers the highest ease-of-use profiling because it can measure even high power beams without the need for complicated attenuation schemes. NanoScan scanheads are available with silicon, germanium and pyroelectric detectors to cover the wide range of spectra and power levels found in the laser industry.

The High Power NanoScan is ideal for applications with focused CO2 laser beams up to 5 kilowatts; it comprises a pyroelectric detector, copper slits and drum, and a cooling fan mounted on the scanhead.

The wide dynamic range of the NanoScan allows for great flexibility in measurement applications, and the rapid update rate makes it ideal for real-time operations such as focusing laser optics, aligning optical trains or any other situation where both focused and unfocused beams need to be measured simultaneously.

The NanoScan is able to measure both CW and kHz pulsed beams with software controllable scan speed and a "peak connect" algorithm. The ability to control the scan speed also helps to increase the dynamic range of any given scanhead, providing even more flexibility of operation.

The NanoScan is available with silicon, germanium and pyroelectric detectors to cover the light spectrum from UV to far infrared beyond 100µm. The scanheads are available in several sizes, apertures and slit dimensions. See the NanoScan Specifications table for available configurations.

Silicon and Germanium detector NanoScans also include a power meter as a standard feature. The power meter is available in two configurations, either 75mW or 200mW. It is designed to be calibrated against a user-provided ISO or NIST traceable power meter. It then provides the convenience of simultaneously displaying beam profile and accurate power levels.

NanoScan integrated software operates on the latest Microsoft Windows Platforms and the system is available with either PCI or USB 2.0 hardware interfaces. The software reports laser beam parameters beam width, pointing, divergence and more for up to 32 beams. Beam width can be determined by 4-sigma, 1/e2, FWHM and any parameter can be charted using time statistics.

For instrument automation the software include ActiveX capability to communicate with other programs and languages, such as LabVIEW, Microsoft Excel, C , Visual C and Visual Basic.

ISO Laser Beam parameters measured with NanoScan:

• Beam size
• Beam width—1/e2, FWHM, or 4-sigma method
• Beam position
• Beam divergence
• Relative power
• Multiple beams (up to 16) simultaneously