Datasheet | January 7, 2009

Datasheet: NanoScan High Precision Beam Profiler

Source: Photon Inc.

The NanoScan scanning-slit profilers provide NIST-traceable precision and accuracy for the measurement of CW and kHz pulsed laser beams across the spectrum range from UV to far infrared. The scanning-slit technology offers the highest ease-of-use profiling because it can measure even high power beams without the need for complicated attenuation schemes.

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