MadAFM™ Sample Scanning AFM
Source: Mad City Labs, Inc.
The MadAFM sample scanning atomic force microscope is powered by industry-leading closed-loop nanopositioners to ensure high-resolution performance, true decoupled motion, and virtually undetectable out-of-plane motion.
The MadAFM™ supports multiple microscopy modes – imaging, electrical, mechanical, magnetic, and force modes – and is controlled by AFMView® control and acquisition software. Among the ease-of-use features arautomated calibration and initialization and simple probe exchange. MadAFM™ is a tabletop sized AFM and does not require on-site installation services.
Features
- Low noise atomic step performance
- Calibrated flexure guided closed loop nanopositioners
- Less than 1nm out of plane motion over scan range
- Proprietary PicoQ® low noise sensors
- Long travel, high stability micropositioning
- Automated calibration and initialization
- Automated software and hardware setup
- Adjustable parameters for experienced users
- User-friendly probe exchange
- Simple to install, table top design
- Includes AFMView® software - hardware control & data acquisition
- Image analysis software option
Applications
- Atomic Force Microscopy
- Phase Microscopy
- Magnetic Force Microscopy
- Electric Force Microscopy
- Lateral Force Microscopy
- Scanning Tunneling Microscopy
- Kelvin Probe Microscopy
- Conductive AFM
- Electric Force Microscopy
- Piezoelectric Force Microscopy
- Nanolithography
- Biological AFM
Mad City Labs, Inc.
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