Low-Noise Extreme Ultraviolet (EUV) Photodetector
The SXUV20C is a new low-noise extreme ultraviolet (EUV) photodetector that is specially designed for high stability over long periods of time when exposed to high intensity EUV energy. The photodetector features superior responsivity in the 1 nm to 200 nm wavelength region, a large 20 mm2 circular active area that provides a substantial surface for easy alignment to the EUV laser, and superior hardness in extreme UV environments.
The SXUV20C EUV photodetector is housed in an industry-standard TO-8 package for simple integration into most UV laser systems. Additional features include high photon flux robustness, minimum shunt resistance of 50 MΩ, reverse breakdown voltage of VR: 1R = 1µa 10 volts, and typical capacitance of C: VR = 0V 3nF.
Download the datasheet for more features, electro-optical characteristics, and thermal parameters on the SXUV20C.