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Whether using an off-the-shelf AFM system with control software implemented or programming a custom-built system from the ground up, user understanding of the basic functions of AFM software, as well as how to optimize experiment flexibility and component interoperability using that software, is critical.
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Atomic force microscopes (AFMs) are versatile tools for characterizing surfaces down to the subnanometer scale. Researchers can build their own AFMs for as little as $30,000 using off-the-shelf components such as nanopositioning stages.
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Commercial quantum scanning microscopes generally are available at a price point more appropriate for multi-user facilities, but a do-it-yourself build is a viable option for users who prefer to modify the experiment setup or do not wish to reserve time on a shared instrument.
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This video describes how to use Mad City Labs SPM Etch kit to produce tungsten tips for atomic force microscopy (AFM). The tungsten tips are attached to quartz tuning forks for use in a resonant probe AFM.
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