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Explore the world of nanoscale structures with atomic force microscopy (AFM) as it goes beyond imaging, delving into nanomechanical characterization. From probing friction forces to nano-manipulation, AFM integrates seamlessly with optical microscopy techniques, enhancing the nanoscopy toolkit for diverse scientific applications.
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Resonant probe atomic force microscopy (AFM) unveils unparalleled capabilities and versatility in exploring physical constants, properties, and surface morphology. Despite its decades-long presence, the technology's intricacies and advantages often remain obscured. Take a closer look at AFM construction, functionality, applications, and the innovative solutions offered by Mad City Labs.
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Magnetic tweezers can apply force and torque to a single molecule and observe its response. At the University of Missouri, Professor Maria Mills and her team use magnetic tweezers to study how proteins alter the structure of DNA. In this text, we will explore the strengths and limitations of magnetic tweezers as used in Professor Mills' research.
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The near-field scanning optical microscope (NSOM) has garnered renewed interest despite past underutilization. This article explores NSOM's evolution, functionality, and diverse applications. From Mad City Labs' innovative systems to advanced methodologies, discover how NSOM augments material characterization and enables high-resolution imaging in various research domains.
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Navigating nanopositioner specifications from various vendors poses challenges due to differing definitions and units. Understanding the story behind these metrics is crucial for real-world applications. Here, we explore the significance of specifications like closed-loop resolution and methods such as atomic force microscopy for accurate verification.
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MadAFM Sample Scanning AFM
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The MadAFM™ Sample Scanning AFM utilizes closed-loop nanopositioners for high-resolution imaging, offering multiple microscopy modes such as electrical, mechanical, and magnetic. Its user-friendly design includes automated calibration and probe exchange, making it suitable for applications from atomic force microscopy to nanolithography and biological research.
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AFM Controller: QS-PLL
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The QS-PLL is an atomic force microscope (AFM) controller designed for use with resonant probes, such as tuning forks, and Mad City Labs nanopositioners and micropositioners. The controller integrates motion control and phase lock loop (PLL) control thus streamlining the hardware interface.
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Download Datasheet
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