Choosing Dichroic Beamsplitters With Flatness/RWE Appropriate To The Microscopy Method

Enhancing the quality of images in microscopy requires minimizing wavefront distortion, which affects contrast and resolution. Optical filters need to be carefully selected, especially in techniques like super-resolution and TIRF microscopy, where even slight deviations in dichroic beamsplitter flatness can hinder success.

This application note helps in choosing Semrock brand catalog filters that are best at reducing wavefront aberrations crucial for microscopy applications. It also explains how substrate bending affects image quality, and how flatness can directly impact reflected wavefront error (RWE) with examples and practical insights. This guide will help researchers determine the ideal flatness standards necessary for various microscopy techniques, ensuring accuracy and clarity in their imaging work.