Zygo Corporation introduces the next generation of optical profiling instruments designed to precisely measure surface area topography quickly and with ease for enhanced productivity and versatility. The Nexview NX2 instrument is based on innovative and versatile non-contact optical technologies. Ideal applications include research, precision engineering, quality control, and advanced manufacturing.
The industry leading Nexview NX2 3D optical profiler delivers significant improvements in both performance and functionality. It utilizes ZYGO’s unique Coherence Scanning Interferometry (CSI) technology, as well as innovative optical techniques enable to non-destructive and precise 3D surface area measurement, including step heights, roughness, film thickness, and surface form on a wide variety of sample types. The profiler also features enhanced hardware and data acquisition technology, and upgraded Mx™ system software for maintaining the highest levels of measurement precision.
Nexview NX2 key features include:
For more information on the Nexview NX2 instruments, download the available brochure.