Yelo TO-Can Laser Diode Test System Reduces Test Time By 25%

Yelo has designed a burn in system to test the reliability of TO-Can laser diodes. Yelo's research and development engineers have significantly reduced the time taken to stabilize devices at test temperature, and provide even temperature control across all devices.

Yelo's TO-Can Laser Test Systems have already been sold to a world leader in optical component manufacturing and shipped to multiple locations across the Far East.

Their test engineers have had nothing but positive comments about the test system.

"Our old system was archaic compared to this tester. We reduced the time taken to stabilize the To-Can lasers at temperature by 25%. In addition our old drawer system had problems with a 10 degree C temperature difference between drawers. This new Yelo system has reduced that to 2 degrees C" said a recent purchaser of the Yelo Laser Burn In System.

As standard all Yelo Laser Burn In Systems automatically take LIV measurements on the lasers during the test and save the data. Extensive graphing is built into the GUI software which means there is no need for time-consuming post data analysis. Secure remote access allows test engineers to see the data without leaving their desks. Constant current and constant power modes are standard in software.

Two models of the TO-Can Laser Test System are available, each unique in its testing environment and functionality. The Laboratory Tester model can be used to lifetest devices and improve test recipes. The Production Tester is used as a simple pass-fail test system in manufacturing environments.

Yelo has been a market leader for over 10 years in Laser Reliability, Lifetest and Burn In Systems. It currently has operational systems with over 34 laser and photonic manufacturer clients worldwide. For more information, visit www.yelo.co.uk.

SOURCE: Yelo Limited