Xenics, Europe's leading developer and manufacturer of advanced infrared detectors, cameras and customized imaging solutions from the SWIR to the LWIR realm, comes to Laser World of Photonics 2017 with its latest developments.
Two of the latest additions to the XLIN detector series, the XLIN-FC SQ series and the XLIN-FC R series, will be announced during the four-day exhibition. Both are ultra-high speed SWIR line scan detectors, suitable for applications in machine vision and spectroscopy.
Xenics exhibits in booth 303 in Hall B3, at the International Congress Center.
The XLIN-FC series are the latest linescan SWIR InGaAs detectors from Xenics, using flip-chip (FC) type hybridization. Two high speed detector types will be available:
The detectors operate in low illumination conditions thanks to a new high-sensitivity ROIC (read-out integrated circuit) developed in-house by Xenics. The InGaAs photodetectors also exhibit a high QE in the 900 to 1700 nm wavelength range.
The detectors come in different resolutions: 512, 1024 or 2048 pixels. Fast in-line inspection is guaranteed with the world-record line rate of up to 400 kHz, for all three resolutions.
Various gain settings are available to optimize performance (sensitivity and dynamic range) in a specific application.
SOURCE: Xenics USA, Inc.