Xenics And Ophir-Spiricon Partner For Laser Beam Profiling Applications That Require InGaAs Cameras

The beam analysis was required for a 1550 nm SWIR laser source with a challenging optical arrangement at Ophir-Spiricon. Since signal loss occurred at each beam transfer across multiple reflective surfaces, a sensitive camera with frame summing was needed to bring out the full beam pattern, size, and depth. This application note discusses how Xenics’ InGaAs camera type Xeva 1.7 320 was used to detect very low power images from either a direct source or a beam reflected off an image plane, as was needed in this application. Download the paper for the full story.