VCSEL Near-Field Profiling And Testing In Production

VCSELs are used in diverse commercial, industrial and consumer device applications. The latest developments of the technology have paved the way to state-of-the-art 3D sensing applications. Combining different testing techniques for optical quality control and characterization – such as VCSEL optical power and energy output measurement, as well as far- and near-field beam analysis – proves to be the most effective way to assure the quality of the VCSELs while efficiently attaining the strived-for production yield. While far-field testing, e.g. with the Ophir Wide Beam Imager (WB-I) as well as power measurement with integrating spheres are designated to analyze entire VCSEL arrays, near-field analyzers allow testing both entire arrays and individual emitters of a VCSEL die. To learn more, download the full application note.