Thermal Imaging Of Power MOSFETs Under Thermal Runaway Conditions
Source: Teledyne FLIR
By Jack Shue and Henning Leidecker
Using a thermal camera and an oscilloscope to look at the voltage and current internal to the MOSFET, we can gain an understanding of how a hot spot develops on the surface of the MOSFET.
access the Application Note!
Log In
Get unlimited access to:
Trend and Thought Leadership Articles
Case Studies & White Papers
Extensive Product Database
Members-Only Premium Content
Welcome Back! Please Log In to Continue.
X
Enter your credentials below to log in. Not yet a member of Photonics Online? Subscribe today.
Subscribe to Photonics Online
X
Subscribe to Photonics Online
Teledyne FLIR
This website uses cookies to ensure you get the best experience on our website. Learn more