Application Note

Thermal Imaging Of Power MOSFETs Under Thermal Runaway Conditions

Source: Teledyne FLIR

By Jack Shue and Henning Leidecker

Using a thermal camera and an oscilloscope to look at the voltage and current internal to the MOSFET, we can gain an understanding of how a hot spot develops on the surface of the MOSFET.

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Teledyne FLIR