Application Note

Thermal Imaging Of Power MOSFETs Under Thermal Runaway Conditions

Source: FLIR Systems, Inc - Research & Science

By Jack Shue and Henning Leidecker

Using a thermal camera and an oscilloscope to look at the voltage and current internal to the MOSFET, we can gain an understanding of how a hot spot develops on the surface of the MOSFET.

FLIR Systems, Inc - Research & Science