The Advantages Of Piezo-Based Scanning Systems For High-Performance Microscopes

Very often, classical microscopic methods are no longer sufficient in terms of optical resolution or information content. To obtain more extensive and more accurate measurement data of a sample, it is now possible to combine different microscopic methods. This combination, however, is very demanding on the systems used for sample positioning. This case study explains why WITec GmbH decided to use piezo-based scanning stages for the design of molecular high-performance microscopes.