Tektronix Unveils Innovative Technology for Performing Optical Communications Test
-OTS9000 Optical Test System Now Best-in-Market Solution for 10 Gb/s SONET/SDH Jitter, Synchronization Analysis-
NFOEC 2000, Denver, August 28, 2000 - Tektronix, Inc.(NYSE: TEK), a leading developer of test, measurement and monitoring equipment, today introduced Digital Phase Analysis (DPA), an innovative, best-in-market jitter and synchronization testing technology for telecommunications networks. By introducing DPA technology into its easy-to-use, cost-effective OTS9000 family of optical test systems, Tektronix enables manufacturers and network operators to meet and perform the 10 gigabit per second (Gb/s) test requirements needed to address the ever expanding global communications infrastructure.
Jitter is the rapid phase shift of digital pulses over the transmission medium (in this case fiber optic cable). Excessive jitter causes errors when the data is recovered. Synchronization is the coordination of communication equipment by clock signals. When the phase shift between clock signals is excessive, service quality degrades and data is lost. For consumers, this means a dropped call or poor quality of service. With the development of today's faster and more complex telecommunications networks, management of jitter and synchronization is increasingly critical.
"Our customers in the Zone - specifically the telecommunications industries - have reached a point in the evolution of their networks where they must be able to perform jitter testing on 10 Gb/s SONET/SDH systems, which are among the fastest, most complex network architectures being deployed globally today," said Scott Bausback, vice president, Communications Business Unit, Tektronix, Inc. "We continue to enable the success of our customers by introducing products and technology such as DPA - the only 10 Gb/s all-digital jitter testing solution on the market at the forefront of innovation."
Jitter Testing at 10 Gb/s
The DPA technology enables jitter and synchronization
analysis critical to equipment manufacturers and network
operators because it allows them to perform 10 Gb/s jitter
testing on data - not just on clocks ¾ with low intrinsic
noise, high jitter accuracy, wide dynamic range, flexible
jitter bandwidths and fast settling. Today, jitter testing
has become a crucial part of 10 Gb/s testing because at this
high data rate, bits are spaced more closely together, so
conforming to international jitter standards becomes critical
to ensuring error-free data transmission and reception over
global communications networks.
New Technology Utilizes Silicon Germanium Technology
The new DPA technology also capitalizes on the Silicon
Germanium (SiGe) technology developed by IBM. SiGe
semiconductors provide high performance and less power consumption
at a lower cost over standard silicon, helping to usher in new
breeds of applications and communications devices. In June 2000,
Tektronix announced it was the first test and measurement
company to employ SiGe technology with the introduction of
the TDS7000 series Digital Phosphor Oscilloscope.
About The OTS9000 Optical Test System
The OTS9000 series of products, announced earlier this year,
is the first optical test system designed to test dense
wavelength-division multiplexing (DWDM) systems at 10 Gb/s.
Based on a modular, common-platform concept, the OTS9000
platform and the field-transportable OTS9010 platform,
share the same modules and the same, Windows-based, easy-to-use
graphical user interface (GUI). These platforms, along with
the 10 Gb/s transmission test module, decrease test time,
manufacturing and deployment costs and time-to-market by
providing user-configurable multi-channel and accelerated bit
error rate testing capabilities for DWDM applications. The
10 Gb/s module allows selection of SONET and SDH through the
GUI, provides OC192c/STM64c payloads and a variety of other
payload structures, performs Section, Line and Path Overhead
analysis, and offers overhead editing, error injection and
intrusive or non-intrusive through modes.
The platforms are cost effective, in that they accept new
modules, such as the 10 Gb/s jitter and synchronization
module, as test requirements grow and change. In addition
to providing test support for equipment manufacturers and network
operators, the OTS9000 series is a solution for customers' research,
design, and product development labs.
Price and Availability
The 10 Gb/s jitter and synchronization module for
SONET/SDH testing for the OTS9000 and OTS9010 platforms from
Tektronix will be available in early 2001. The same module
will be able to analyze wander at 10 Gb/s as well as jitter and
wander at 2.5 Gb/s, 622 Mb/s and 155 Mb/s, through a software
upgrade, which will be available for purchase at a later date.
Prices depend on configurations. For more information about this
product, or other measurement solutions from Tektronix, please
visit www.tektronix.com. Or, call (800) 426-2200 (code 1204),
fax (503) 222-1542, or write to Tektronix, Inc., P.O. Box 3960,
Portland, OR 97208-3960.
About Tektronix
Tektronix, Inc. is a test, measurement, and monitoring
company providing measurement solutions to the semiconductor,
computer, and telecommunications industries. With over 50 years
of experience, Tektronix enables its customers to design, build,
deploy and manage next-generation global communications networks
and Internet technologies. Headquartered in Beaverton, Oregon,
Tektronix has operations in 25 countries worldwide.
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Tektronix is a registered trademark of Tektronix, Inc. All other
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