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SWIR InGaAs Detectors Using Flip-Chip (FC) Type Hybridization: XLIN-FC Series

Source: Xenics

SWIR InGaAs Detectors Using Flip-Chip (FC) Type Hybridization: XLIN-FC Series

The XLIN-FC Series from Xenics comprises the latest line scan SWIR InGaAs arrays for medical (3D SD-OCT) and machine vision applications, that at the same time require high resolution and low noise. These line array detectors feature low noise and 400 kHz line rate at 512, 1024 or 2048-pixel resolution.

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The detectors use flip-chip (FC) hybridization and operate in low illumination conditions thanks to highly sensitive Read-Out Integrated Circuit (ROIC). Five gain settings allow the user to benefit from optimum performance either in high dynamic range mode, or high sensitivity mode.

Now a finalist in the Prism Awards 2018 for the category of detectors and sensors, visit booth #2235 at 2018 Photonics West to learn more about the revolutionary detector series from Xenics.

XLIN-FC SQ (Square series) features:

  • Square pixels with a 12.5 µm pixel pitch and height
  • Total array length does not exceed 25.6 mm
  • Ideal applications include sorting, waste recycling, remote sensing, and (micro-)crack detection in solar cell wafers or ingots

XLIN-FC R (Rectangular series) features:

  • Rectangular pixels with a pitch of 12.5 µm, and a pixel height for 250 µm
  • Total array length does not exceed 25.6 mm
  • Suitable for general SWIR spectroscopy applications
  • extends the application area of OCT towards higher spatial resolution, providing detailed imaging for medical applications and analysis

Contact Xenics for more information on this series.

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