Product/Service

SWIR InGaAs Detectors Using Flip-Chip (FC) Type Hybridization: XLIN-FC Series

Source: Xenics

SWIR InGaAs Detectors Using Flip-Chip (FC) Type Hybridization: XLIN-FC Series

The XLIN-FC Series from Xenics comprises the latest line scan SWIR InGaAs detectors utilizing flip-chip (FC) type hybridization. These detectors are available in two high-speed detector types with 512-, 1024-, or 2048-pixel resolution. 

Request Information

The XLIN-FC detectors are manufactured to operate within low illumination conditions with the new high-sensitivity read-out integrated circuit (ROIC) developed in-house by Xenics. These detectors also include guaranteed fast in-line inspection with a world-record line rate up to 400 kHz for all resolutions.

XLIN-FC SQ (Square series) features:

  • Square pixels with a 12.5 µm pixel pitch and height
  • Total array length does not exceed 25.6 mm
  • Ideal applications include sorting, waste recycling, remote sensing, and (micro-)crack detection in solar cell wafers or ingots

XLIN-FC R (Rectangular series) features:

  • Rectangular pixels with a pitch of 12.5 µm, and a pixel height for 250 µm
  • Total array length does not exceed 25.6 mm
  • Suitable for general SWIR spectroscopy applications
  • extends the application area of OCT towards higher spatial resolution, providing detailed imaging for medical applications and analysis

Contact Xenics for more information on this series.

Need More Information? Just Ask.

Click the button below to directly contact the supplier. Use it to:

  • Ask a question.
  • Request more detailed information or literature.
  • Discuss your current project/application.
  • Request a quote.
  • Locate a distributor in your area.
  • Schedule a demo.
Request Information