Xeva-1.7-320 Brochure: SWIR Imaging Camera for Advanced Research

Xenics’ Xeva-1.7-320 digital camera combines a thermo-electrically cooled InGaAs detector head and the control and communication electronics in a compact housing. Single or three-stage Peltier cooling reduces the noise and dark current for enhanced low light-level imaging. The Xeva-1.7-320 combines standard (up to 1.7 µm) InGaAs detector arrays with various speed versions: 60 Hz, 100 Hz and 350 Hz. This allows you to choose the most suitable detector-camera configuration for applications including SWIR microscopy, hyperspectral imaging, laser beam profiling, low-light level imaging, semiconductor inspection, and medical applications.