StellarNet Announces New Line Of Low-Cost Thin Film Measurement Systems

By StellarNet, Inc.

StellarNet has announced a new line of surprisingly low cost Thin Film measurement systems. The non-contact thickness measurement systems come complete with the necessary instrumenta-tion and software which includes a large library of materials data to support multilayer (up to 5 ), freestanding, rough, and both thick & thin layer structures. Thickness and optical constants (n, k) can be measured quickly and easily using reflectance and/or transmittance spectroscopy with analysis provided in just seconds. With USB2 connectivity, the powerful and user-friendly TFCompanion software provides complex measurements via user configurable measurement recipes. Supported parameterized materials include Cauchy, Sellmeir, EMA (effective-medium approximation), Harmonic oscillator, Tauc-Lorentz oscillator, Drude-Lorentz, and many more.