Slit-Scan Beam Profilers: BeamMap2/Beam'R2 Series
Source: DataRay Inc.
This series of slit-scan beam profilers consists of nine different models with varying specifications and capabilities. Each model features 0.05 μm sampling and 0.1 μm resolution. These beam profilers are used in laser and laser assembly verification applications involving laser printing/marking, diode laser instruments, medical lasers, fiber optic telecom assembly focusing, and more.
Additional information on features and specifications can be found on the available datasheet, as well as a side-by-side comparison of the BeamMap 2 slit-scan beam profilers and the Beam’R2