PSIA Changes Name To Park Systems Corp. To Reflect Focus On Nanometrology Systems, Software And Expertise

Santa Clara, CA - PSIA, Inc., a provider of nanoscale measurements and systems for both research and industry, announced that it is now Park Systems Corporation. Headquartered in Suwon, Korea, with corporate offices in Santa Clara, CA and Tokyo, Japan, the ten-year-old company will continue to focus on providing complete nanometrology systems, software and technical expertise for research and development applications and for industrial applications in the semiconductor and hard disk drive (HDD) manufacturing industries.

Making its premiere as Park Systems Corp. at Spring 2007 Meeting of the Materials Research Society (MRS) in San Francisco, CA on April 10, the company will demonstrate its new XE-70 Atomic Force Microscope (AFM) in Booth 333. The XE-70 is an economical addition to its XE Series of Atomic Force Microscopes (AFM) and is designed for general small sample measurement using manual optics while supporting the same modes, options and electronics of conventional AFMs.

"Our name change to Park Systems reflects the new breadth and depth of our complete systems, for R&D, for hard disk inspection and metrology, and for pole tip recession data acquisition and analysis," said Park Systems' Vice President of Operations, Dr. Sung Park. "We are one of only two manufacturers offering all of the most commonly required modes that help companies push the limits of physics. By providing a high quality system solution at a lower cost than our competitors, we're giving customers a much-needed alternative."

SOURCE: PSIA, Inc.