Polarization Metrology Of Anisotropic Materials

Dr. John Freudenthal, Application Scientist

Full Mueller matrix measurements allow for elimination of ambiguity and a fuller understanding of polarization metrology. The Exicor^® 150XT system offers complete Mueller matrix measurement from 350nm to 800nm with automated sample translation and optional tip-tilt measurements. Integration times as low as 0.01 seconds for measurements of the Mueller matrix to 0.001. Partial Mueller matrix systems can attain measurements of 8 Mueller parameters with precision of 0.0001.

Polarization metrology covers a broad range of techniques from ellipsometry, circular dichroism, and transmission polarimetry. Each technique focuses on the measurement and modeling of a subset of possible polarimetric interactions of a sample. Mueller matrix polarimetry in both transmission and reflection can address the needs of a broad range of applications with a single system, and unite a range of different metrology techniques under a single banner.