Datasheet | May 24, 2017

PIFOC® Objective Scanning System Datasheet

Source: PI (Physik Instrumente) LP

The P-725 high-speed piezo-Z optical-axis objective positioners are designed to deliver higher performance and lower costs for microscopy, metrology, 3D imaging, screening, autofocus systems, surface analysis, and wafer inspection applications. The systems feature travel ranges up to 460 µm, and are composed of a PIFOC® high performance fast piezo focus devices, a compact digital servo controller, a comprehensive software package, and a QuickLock adapter for easy attachment. For more information on these high-speed piezo z-stage and digital controller packages, download the datasheet.