Photon Dynamics To Supply Inspection System to National Semiconductor

Test and inspection system manufacturer Photon Dynamics Inc. (San Jose, CA) announced it has received a purchase order from National Semiconductor Corp. (Santa Clara, CA) for its MicroMaster inspection system, which will be used to inspect liquid-crystal-on-silicon (LCOS) displays. The small, reflective displays are used in a variety of applications, such as rear-projection televisions and monitors, business projectors, cell phones, digital cameras and viewfinders.

The MicroMaster system features the standard flat panel display (FPD) inspection tests, plus a specially designed optics sub-assembly to illuminate the displays, and a specialized blemish defect detection algorithm to increase throughput and identify a higher level of defect.