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Nanopositioners provide unmatched stability, precision, and repeatability, yet their full potential is often misunderstood. A proper understanding unlocks enhanced experimental accuracy and performance, enabling researchers to achieve more reliable, reproducible results across diverse scientific and industrial applications.
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AFM users often focus on factors like sample material and stage speed, overlooking the critical role of scanning motion flatness. Flatness issues can distort measurements, yet are frequently misattributed to equipment faults, highlighting the importance of understanding and controlling scanning motion for accurate, reliable results.
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Through a deep knowledge of sensing technologies, technically adept personnel, and experience across a bevy of applications, Mad City Labs helps our customers operate smaller and more cost-effectively than any competitor. We want you to say, “show me what you have done,” and “tell me how you can make this work for my application.”
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Mad City Labs' Shannon Ghorbani details how extreme metrology applications, from long baseline interferometry to atomic force microscopy, benefit from picometer-scale resolution. Learn why minimizing position noise is crucial and how Mad City Labs can enhance your setup, regardless of scale.
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